| 008 |
|
800709s1980 xxka b 101 0 eng d |
| 015 |
|
|aGB***
|
| 020 |
|
|a0854981438 (pbk) : |c00
|
| 035 |
|
|aNF000040887
|
| 040 |
|
|aTMUE|beng|cTMUE|dTMUE|eCCR
|
| 050 |
14
|
|aQH212.E4|bE379
|
| 082 |
04
|
|a502/.8/25|219
|
| 084 |
|
|a305.42|bF329|2ncsclt
|
| 090 |
|
|a01|b|p|tDDC|d305.42|eF329|cA0144328|y1980|r0.0
|
| 090 |
|
|a01|b|p|tDDC|d305.42|eF329|cA0144889|y1980|r0.0
|
| 090 |
|
|a01|b|p|tDDC|d305.42|eF329|cA0147171|y1980|r46.0
|
| 090 |
|
|a01|b|p|tDDC|d305.42|eF329|cA0149317|y1980|r828.0
|
| 100 |
1
|
|aMulveyT
|
| 245 |
10
|
|aElectron microscopy and analysis, 1979 : |bproceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held atthe University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) / |cedited by T. Mulvey
|
| 260 |
|
|aBristol : |bInstitute of Physics, |c1980
|
| 300 |
|
|axv, 472 p : |bill ; |c24 cm
|
| 490 |
1
|
|aConference series - Institute of Physics ; no. 52
|
| 504 |
|
|aIncludes bibliographical references and indexes
|
| 650 |
0
|
|aElectron microscopy|xCongresses
|
| 650 |
0
|
|aMicroprobe analysis|xCongresses
|
| 710 |
2
|
|aInstitute of Physics (Great Britain)|bElectron Microscopy and Analysis Group
|
| 830 |
0
|
|aConference series - Institute of Physics ; no. 52
|
借閱次數
: 
點閱：230
評分：0
評論：0
引用：0
