| 008 |
|
920729s19uu ch 000 0 chi d |
| 020 |
|
|a0716781794 : |cNT$652
|
| 040 |
|
|aTMUE|beng|cTMUE|dTMUE|eCCR
|
| 084 |
|
|a621.3815|bA161|2ncsclt
|
| 100 |
1
|
|aAbramoviciMiron
|
| 245 |
10
|
|aDigital systems testing and testable design / |cMiron Abramovici ; Melvin A. Breuer, Arthur D. Friedman
|
| 260 |
|
|aNew York : |bComputer Science Press, |cc1990
|
| 300 |
|
|axxi, 653 p : |bill ; |c24 cm
|
| 504 |
|
|aIndex: p. 647-653
|
| 541 |
|
|aNT$652
|
| 650 |
0
|
|aDigital integrated circuits|xTesting
|
| 700 |
1
|
|aBreuer Melvin A
|
| 700 |
1
|
|aFriedman Arthur D
|
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