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061020s2005 pg a b 001 0 eng d |
| 020 |
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|a352740502X
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| 035 |
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|a00241457
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| 040 |
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|aTMUE|beng|cTMUE|dTMUE
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| 050 |
14
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|aTA418.9.N35|bN39 2005
|
| 082 |
04
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|a620.50287|222
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| 245 |
00
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|aNanoscale calibration standards and methods : |bdimensional and related measurements in the micro- and nanometer range / |cedited by Gnter Wilkening, Ludger Koenders
|
| 260 |
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|aWeinheim : |bWiley-VCH, |cc2005
|
| 300 |
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|axxii, 519 p : |bill ; |c25 cm
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| 500 |
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|aConference proceedings
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| 504 |
|
|aIncludes bibliographical references and index
|
| 650 |
0
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|aNanostructured materials|xMeasurement
|
| 650 |
0
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|aMicrostructure|xMeasurement
|
| 650 |
0
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|aScientific apparatus and instruments|xCalibration
|
| 650 |
0
|
|aStereology
|
| 700 |
1
|
|aWilkening Gnter
|
| 700 |
1
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|aKoenders Ludger
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