| 008 |
|
780928s1978 ng af b 101 0 eng d |
| 015 |
|
|a78022081 //r89
|
| 020 |
|
|a0444851305
|
| 035 |
|
|a78022081
|
| 040 |
|
|aTMUE|beng|cTMUE|dTMUE
|
| 050 |
14
|
|aTA417.23|bD54 1978
|
| 082 |
04
|
|a620.1/127
|
| 090 |
|
|a01|b|p|tDDC|d620.1127|eD569|cA0071629|lv.1|r0.0
|
| 245 |
00
|
|aDiffraction and imaging techniques in material science / |ceditors, S. Amelinckx, R. Gevers, J. Van Landuyt
|
| 250 |
|
|a2nd revised ed
|
| 260 |
|
|aAmsterdam ; |aNew York : |bNorth-Holland Pub. Co : |bsole distributors for the U.S.A. and Canada, Elsevier North-Holland, |c1978
|
| 300 |
|
|a2 v. (xvii, 847 p., [1] fold. leaf of plates) : |bill ; |c23 cm
|
| 500 |
|
|aComprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science
|
| 504 |
|
|aINCLSBRINX
|
| 505 |
1
|
|av. 1. Electron microscopy--v. 2. Imaging and diffraction techniques
|
| 650 |
0
|
|aElectron microscopy|xCongresses
|
| 650 |
0
|
|aElectrons|xDiffraction|xCongresses
|
| 650 |
0
|
|aImaging systems|xCongresses
|
| 700 |
1
|
|aAmelinckx S|q((Severin)
|
| 700 |
1
|
|aGevers R
|
| 700 |
1
|
|aLanduyt J. van
|
| 710 |
2
|
|aInternational Summer Course on Material Science|d1969|cAntwerp, Belgium)
|
借閱次數
: 
點閱：258
評分：0
評論：0
引用：0
