| 008 |
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120128s2011 gw a b 001 0 eng |
| 010 |
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|a2012359077
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| 020 |
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|a9783527320479 : |c(hbk.)
|
| 040 |
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|aDLC|cDLC|dDLC|dTMUE|beng|eaacr
|
| 042 |
|
|apcc
|
| 050 |
00
|
|aQC176.84.S93|bS87 2011
|
| 082 |
00
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|a620/.44|223
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| 245 |
10
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|aSurface and thin film analysis : |ba compendium of principles, instrumentation, and applications / |cedited by Gernot Friedbacher and Henning Bubert.
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| 250 |
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|a2nd, completely rev. and enlarged ed.
|
| 260 |
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|aWeinheim : |bWiley-VCH, |cc2011.
|
| 300 |
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|axxiv, 533 p. : |bill. (some col.) ; |c25 cm.
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| 504 |
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|aIncludes bibliographical references and index.
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| 650 |
0
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|aThin films|xSurfaces|xAnalysis.
|
| 650 |
0
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|aElectron spectroscopy.
|
| 650 |
0
|
|aSpectrum analysis.
|
| 700 |
1
|
|aFriedbacher, Gernot.
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| 700 |
1
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|aBubert, H.|q(Henning)
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